Welcome to the Secondary Ion Mass Spectrometry Facility, located in Northrop Hall of the UNM Main Campus. This page gives details on our instrumentation, its capabilities and uses, and rates for usage and sample preparation. Please use the menu bar above or the links below to visit the page's various sections.

SIMS Instrument

This section describes the capabilities of our Cameca ims 4f Ion Microprobe, provides a basic description of secondary ion mass spectrometry, and lists usage rates and costs.

Trace Element Analysis

This section provides details on how trace elemental analysis is performed and how the data are reduced from the raw counting information.

Sample Size and Preparation

This section gives details on preparing samples for SIMS analysis.

Contact us

For further information please contact:

Chip Shearer

Laboratory Manager
Institute of Meteoritics
MSC03 2050
1 University of New Mexico
Albuquerque, NM 87131-0001
E-mail: cshearer /at/ unm /dot/ edu

Phone: 505-277-9159
Fax: 505-277-3577