Welcome to the Secondary Ion Mass Spectrometry Facility, located in Northrop Hall of the UNM Main Campus. This page gives details on our instrumentation, its capabilities and uses, and rates for usage and sample preparation. Please use the menu bar above or the links below to visit the page's various sections.
This section describes the capabilities of our Cameca ims 4f Ion Microprobe, provides a basic description of secondary ion mass spectrometry, and lists usage rates and costs.
Trace Element Analysis
This section provides details on how trace elemental analysis is performed and how the data are reduced from the raw counting information.
Sample Size and Preparation
This section gives details on preparing samples for SIMS analysis.
For further information please contact:
Institute of Meteoritics
1 University of New Mexico
Albuquerque, NM 87131-0001
E-mail: cshearer /at/ unm /dot/ edu